Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Name: Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer
Brand: DONGGUAN LONROY EQUIPMENT CO LTD
Availability: InStock

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Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Large Image : Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Product Details:

Place of Origin:	Guangdong, China
Brand Name:	LONROY

Payment & Shipping Terms:

Minimum Order Quantity:	1

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Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Description

Type:	Testing Machine	Accuracy Class:	High Accuracy
Accuracy:	/	Application:	Auto Testing
Customized Support:	OEM, ODM, OBM	Power:	--
Protection Class:	Ip56	Voltage:	220 V
Warranty:	1 Year	Polarizers:	Glan-Thompson
Fiber:	Anti-UV Passivation; NA=0.22;clear Aperture 600um	Power:	220VAC+10%
Room Temperature:	Environment Temperature(10-30)℃
Highlight:	spectroscopic ellipsometer optical films analyzer , customized in-situ spectral ellipsometer , lab test machine for optical films

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

I. Overview

LR-A426 is an integrated in-situ spectroscopic ellipsometer designed for organic/inorganic coatings. The need for membrane process research is to develop customized in-situ film online monitoring technology. Develop and rapidly implement in-situ characterization and analysis of optical films.

II. Test Cases

Film-forming process monitoring

Film thickness characterization

III. Product Applications

It is widely applied in the physical/chemical vapor deposition, ALD deposition and other optical film processing procedures of metal films, organic films and inorganic films. It can conduct in-situ online monitoring during the process and provide real-time feedback on the measured physical property data.

Integrated In-situ Spectroscopic Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Technical Specification

Incident angle	65°
Beam deviation	< 0.3°
Measurement parameters	Psi&Del,TanPsi&CosDel,Alpha&Beta
Polarizers	Glan-Thompson
Material	a-BBO
Compensator	quarter-wave phase delay, hyper achromatic
Intensity selection	Linear optical density selection element. Ensures good signal-to-noise ratio in measurement process, improves data accuracy, avoids light intensity to saturate or too weak to reduce the signal-to-noise ratio and accuracy
Optical design	dual fiber convey the light from lamp to spectrometer through polarization elements;stable light path, convenient to change lamps
Fiber	anti-UV passivation; NA=0.22;clear aperture 600um
Micro light spot	diameter ≤200um, to distinguish between the useful light reflected from front surface and the useless light reflected from the bottom surface, easy to disassemble
Slit	1 50um, for distinguishing between the useful light reflected from front surface and the useless light reflected from the bottom surface

Tag:

Contact Person: Kaitlyn Wang

Tel: 19376687282

Fax: 86-769-83078748

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Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

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