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Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

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CHINY DONGGUAN LONROY EQUIPMENT CO LTD Certyfikaty
CHINY DONGGUAN LONROY EQUIPMENT CO LTD Certyfikaty
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Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer
Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Duży Obraz :  Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Szczegóły Produktu:
Miejsce pochodzenia: Guangdong, Chiny
Nazwa handlowa: LONROY
Zapłata:
Minimalne zamówienie: 1

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

Opis
Typ: Maszyna testowa Klasa dokładności: Wysoka dokładność
Dokładność: / Aplikacja: Testowanie automatyczne
Indywidualne wsparcie: OEM, ODM, OBM Moc: --
Klasa ochrony: IP56 Woltaż: 220 V
Gwarancja: 1 rok Polaryzatory: Glan-Thompson
Błonnik: pasywacja anty-UV; NA = 0,22; przezroczysta apertura 600um Moc: 220 V AC + 10%
Temperatura pokojowa: temperatura otoczenia (10-30) ℃
Podkreślić:

spectroscopic ellipsometer optical films analyzer

,

customized in-situ spectral ellipsometer

,

lab test machine for optical films

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

 

I. Overview

LR-A426 is an integrated in-situ spectroscopic ellipsometer designed for organic/inorganic coatings. The need for membrane process research is to develop customized in-situ film online monitoring technology. Develop and rapidly implement in-situ characterization and analysis of optical films.

 

 

II. Test Cases

 Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 0

 

Film-forming process monitoring

 

 Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 2

 

Film thickness characterization

 

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 4

 

 

III. Product Applications

It is widely applied in the physical/chemical vapor deposition, ALD deposition and other optical film processing procedures of metal films, organic films and inorganic films. It can conduct in-situ online monitoring during the process and provide real-time feedback on the measured physical property data.

 

  

 

Integrated In-situ Spectroscopic Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer

 

Technical Specification

 

Incident angle

65°

Beam deviation

< 0.3°

Measurement parameters

Psi&Del,TanPsi&CosDel,Alpha&Beta

Polarizers

Glan-Thompson

Material

a-BBO

Compensator

quarter-wave phase delay, hyper achromatic

Intensity selection

Linear optical density selection element. Ensures good signal-to-noise ratio in measurement process, improves data accuracy,
avoids light intensity to saturate or too weak to reduce the signal-to-noise ratio and accuracy

Optical design

dual fiber convey the light from lamp to spectrometer through polarization elements;stable light path, convenient to change lamps

Fiber

anti-UV passivation; NA=0.22;clear aperture 600um

Micro light spot

diameter ≤200um, to distinguish between the useful light reflected from front surface and the useless light reflected from the
bottom surface, easy to disassemble

Slit

1 50um, for distinguishing between the useful light reflected from front surface and the useless light reflected from the bottom
surface

 

 

 

 

Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 6Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 8Integrated In-situ Spectral Ellipsometer Optical Films In-situ Analysis Machine Customized Spectroscopic Ellipsometer 10

Szczegóły kontaktu
DONGGUAN LONROY EQUIPMENT CO LTD

Osoba kontaktowa: Kaitlyn Wang

Tel: 19376687282

Faks: 86-769-83078748

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