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Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

प्रमाणन
चीन DONGGUAN LONROY EQUIPMENT CO LTD प्रमाणपत्र
चीन DONGGUAN LONROY EQUIPMENT CO LTD प्रमाणपत्र
मैं अब ऑनलाइन चैट कर रहा हूँ

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument
Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

बड़ी छवि :  Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

उत्पाद विवरण:
उत्पत्ति के प्लेस: गुआंग्डोंग, चीन
ब्रांड नाम: LONROY
भुगतान & नौवहन नियमों:
न्यूनतम आदेश मात्रा: 1

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

वर्णन
प्रकार: परीक्षण मशीन सटीकता वर्ग: उच्च सटीकता
शुद्धता: / आवेदन: स्वत: परीक्षण
अनुकूलित समर्थन: ओईएम, ओडीएम, ओबीएम शक्ति: -
संरक्षण वर्ग: आईपी56 वोल्टेज: 220 वी
गारंटी: 1 वर्ष तरंग दैर्ध्य सीमा: 250 एनएम से 1700 एनएम
हाजिर आकार: 1 मिमी से 5 मिमी (परिवर्तनीय) नमूने का आकार: व्यास में 200 मिमी तक
माप काल: प्रति स्थिति बिंदु लगभग 1 सेकंड
प्रमुखता देना:

micro-area spectroscopic ellipsometer

,

pattern structure measurement instrument

,

lab spectroscopic ellipsometer with warranty

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

 

 

I. Overview 

LR-SE-M is a dedicated spectroscopic ellipsometer customized for the semiconductor industry for micro-area pattern structure measurement. It adopts 1. ultra-miniature light spot detection measurement technology and 2. customized ultra-fast measurement speed technology. It can be applied to the measurement of n/k/d of anti-reflection films, conductive films and other thin films on various transparent substrates, and is perfectly suitable for the optical parameter analysis of various micro-area patterns.

 

II. Special Features

1. The spot size can be customized, with the minimum reaching 30um.

2. Ultra-fast measurement, with a single measurement time of less than 0.5 seconds;

3. The series configuration is flexible and supports customized functional design.

4. Compact structure, more suitable for online integrated measurement.

 

III. Measurement Examples

Microstructure measurement of captured area in the image

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument 0

  

 

 

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument

 

Technical Specification

 

Wavelength Range

250 nm to 1700 nm

Spot Size

1 mm to 5 mm (variable)

Sample Size

Up to 200 mm in diameter

Measurement Thickness Range*

~30 μM

Measurement Time

Approximately 1 second per position point

Incident Angle Range

20° to 90° (5-degree intervals)

Repeatability Error*

Less than 1 Å (angstrom)

 

 

 

 

Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument 2Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument 4

सम्पर्क करने का विवरण
DONGGUAN LONROY EQUIPMENT CO LTD

व्यक्ति से संपर्क करें: Kaitlyn Wang

दूरभाष: 19376687282

फैक्स: 86-769-83078748

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