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उत्पाद विवरण:
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| प्रकार: | परीक्षण मशीन | सटीकता वर्ग: | उच्च सटीकता |
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| शुद्धता: | / | आवेदन: | स्वत: परीक्षण |
| अनुकूलित समर्थन: | ओईएम, ओडीएम, ओबीएम | शक्ति: | - |
| संरक्षण वर्ग: | आईपी56 | वोल्टेज: | 220 वी |
| गारंटी: | 1 वर्ष | तरंग दैर्ध्य सीमा: | 250 एनएम से 1700 एनएम |
| हाजिर आकार: | 1 मिमी से 5 मिमी (परिवर्तनीय) | नमूने का आकार: | व्यास में 200 मिमी तक |
| माप काल: | प्रति स्थिति बिंदु लगभग 1 सेकंड | ||
| प्रमुखता देना: | micro-area spectroscopic ellipsometer,pattern structure measurement instrument,lab spectroscopic ellipsometer with warranty |
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Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument
I. Overview
LR-SE-M is a dedicated spectroscopic ellipsometer customized for the semiconductor industry for micro-area pattern structure measurement. It adopts 1. ultra-miniature light spot detection measurement technology and 2. customized ultra-fast measurement speed technology. It can be applied to the measurement of n/k/d of anti-reflection films, conductive films and other thin films on various transparent substrates, and is perfectly suitable for the optical parameter analysis of various micro-area patterns.
II. Special Features
1. The spot size can be customized, with the minimum reaching 30um.
2. Ultra-fast measurement, with a single measurement time of less than 0.5 seconds;
3. The series configuration is flexible and supports customized functional design.
4. Compact structure, more suitable for online integrated measurement.
III. Measurement Examples
Microstructure measurement of captured area in the image
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Spectroscopic Ellipsometer for Micro-area Pattern Structure Measurement Spectroscopic Ellipsometer Instrument
Technical Specification
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Wavelength Range |
250 nm to 1700 nm |
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Spot Size |
1 mm to 5 mm (variable) |
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Sample Size |
Up to 200 mm in diameter |
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Measurement Thickness Range* |
~30 μM |
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Measurement Time |
Approximately 1 second per position point |
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Incident Angle Range |
20° to 90° (5-degree intervals) |
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Repeatability Error* |
Less than 1 Å (angstrom) |
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व्यक्ति से संपर्क करें: Kaitlyn Wang
दूरभाष: 19376687282
फैक्स: 86-769-83078748