Photovoltaic-specific Spectral Ellipsometer Film Thickness Tester Photovoltaic Cell Optical Constants Test Machine

Photovoltaic-specific Spectral Ellipsometer Film Thickness Tester Photovoltaic Cell Optical Constants Test Machine

I. Overview

The SE-PV series is a photovoltaic-specific spectral ellipsometer developed by Lonroy. Based on the modulation technology of rotating compensators, it can simultaneously obtain polarization signals such as Psi/Delta, N/C/S. This instrument can rapidly characterize the film thickness and optical constants of both textured and non-textured samples in the photovoltaic industry. The SE-PV uses a high-power light source and features a brand-new optical path design, which significantly enhances the signal-to-noise ratio of the detected signals. It adopts a horizontal/tilted integrated sample stage, allowing for quick and easy switching between measurement modes to complete measurements on both textured and non-textured samples.

II. Product Features

1. Dual-rotor compensator configuration

2. Quick switch to measurement mode (one-click switch)

III. Product Applications

The unique design of SE-PV can meet the measurement requirements for thin films on velvet substrates. As shown in the sample in the figure below, the design of the velvet surface and its anti-reflective coating layer is aimed at reducing the reflection of the solar light on the surface of the battery sheet, which makes the detection signal weaker and significantly increases the difficulty of optical measurement.

Photovoltaic-specific Spectral Ellipsometer Film Thickness Tester Photovoltaic Cell Optical Constants Test Machine

Technical Specification