| 유형: | 테스트 머신 | 정확도 등급: | 높은 정확도 |
|---|---|---|---|
| 정확성: | / | 애플리케이션: | 자동 테스트 |
| 맞춤형 지원: | OEM, ODM, OBM | 힘: | - |
| 보호 등급: | IP56 | 전압: | 220 v |
| 보증: | 1년 | 반복성 측정 정확도: | 0.01Nm |
| 입사각 범위: | 45-90° | 매핑 스트로크: | 100*100mm (선택) |
| 지원되는 샘플 크기: | 최고 200까지 밀리미터 | ||
| 강조하다: | spectroscopic ellipsometer lab machine,mapping spectroscopic ellipsometry equipment,factory price spectral ellipsometer |
||
Mapping Spectroscopic Ellipsometer Spectral Ellipsometer Spectroscopic Ellipsometry Machine Factory Price
I. Overview
The ME-Mapping Spectral Ellipsometer is a customizable Mapping measurement spectrometer capable of mapping. It is equipped with an automatic Mapping measurement module and can quickly achieve self-defined mapping measurement characterization and analysis of film thickness and optical parameters through the measurement of ellipsometric parameters and transmission/reflection rates.
1. Complete solution for ellipsometry mapping and measurement of the entire substrate;
2. Supports product design and customization of functional modules, with one-click measurement drawing;
3. Configure the Mapping module, enabling full substrate custom multi-point positioning measurement capability;
4. The abundant database and geometric structure model library ensure a powerful data analysis capability.
II. Product Features
1. A composite light source consisting of deuterium lamps and halogen lamps is adopted, with the spectral range covering from ultraviolet to near-infrared (193 - 2500 nm).
2. High-precision rotation compensator modulation and PCRSA configuration enable high-speed acquisition of Psi/Delta spectral data.
3. It has the capability of fully customizing multi-point automatic positioning measurement for the entire substrate, and provides comprehensive film thickness detection and analysis reports;
4. Hundreds of material databases and multiple algorithm model libraries are available, covering the vast majority of current photovoltaic materials.
III. Product Applications
ME-Mapping is widely used in industrial applications such as OLED, LED, photovoltaic, and integrated circuits, enabling rapid measurement and characterization of large-area substrate film thickness, optical constants, and film thickness distribution.
Mapping Spectroscopic Ellipsometer Spectral Ellipsometer Spectroscopic Ellipsometry Machine Factory Price
Technical Specification
|
Model |
ME-Mapping |
|
Application positioning |
Automatic type |
|
Basic functions |
Psi/Delta, N/C/S, R/T and other spectra |
|
Analytical spectrum |
380-1000nm (support expansion to 193- 1650nm) |
|
Single measurement time |
S15s |
|
Repeatability measurement accuracy |
0.01nm |
|
Spot size |
Large spot 2-4mm, micro spot 200um/100um |
|
Refractive index repeatability accuracy |
0.0005
|
|
Incident angle range |
45-90° |
|
Incident angle adjustment method |
Automatic variable angle |
|
Focus method |
Automatic focus |
|
Mapping stroke |
100*100mm (optional) |
|
Supported sample size |
Up to 200mm |
담당자: Kaitlyn Wang
전화 번호: 19376687282
팩스: 86-769-83078748
Korean
