The AL-Y3500xrdf instrument is a high-end analytical device that integrates X-ray diffraction technology (XRD) and X-ray spectroscopy technology (EDS). It is mainly used for the elemental composition analysis and structural characterization of materials. Through a single measurement, it can simultaneously obtain key information such as the elemental composition, crystal structure, phase composition, and grain size of the material. It is widely applied in fields such as materials science, geology, physics, chemistry, biology, semiconductor, catalyst characterization, metal matrix analysis, and nanotechnology.

Features:

1.Efficient integration: A single measurement can simultaneously obtain diffraction and spectroscopy data, eliminating the time-consuming and error-prone process of traditional step-by-step measurements.
2.High sensitivity and accuracy: Utilizing advanced detectors and algorithms, the detection limit is as low as the ppm level, and the structural resolution accuracy reaches the atomic level.
3.Multi-functional expansion: Various functional accessories meet the needs of different testing purposes. They support various sample forms (powder, block, film, etc.), are compatible with special environments such as high temperature, low temperature, and high pressure, and are equipped with a high-stability X-ray generator control system to achieve more stable repeat measurement accuracy.
4.Hardware integration: Sharing the X-ray source, sample stage and control system to ensure the synchronization of the optical paths and signal matching of the two technologies.
5.Data fusion: Through dedicated software, the diffraction patterns and spectral data are jointly analyzed. By integrating the crystal structure information from X-ray diffraction (XRD) and the elemental composition data from X-ray fluorescence spectroscopy (XRF), the full-dimensional characterization of the substance is achieved.
6.Identification of one or more crystal phases in unknown samples can be carried out simultaneously, and 40 elements can be analyzed at the same time.
7.Utilizing multiple collimators and solar slit system, it features proprietary intellectual property technology.
8.Crystal structure analysis (Rietveld structure analysis) is carried out, including basic parameters, empirical coefficient method, etc.
9.Under unconventional conditions (such as high and low temperatures), the crystal structure can change, and multiple sample platforms can be accommodated.

10.Analysis of thin film samples, including the crystal phase of the film, the thickness of multilayer films, surface roughness, and charge density.
11.Analysis of micro-area samples, metal material texture, and stress analysis.

Technical Parameter