lSO 22007 Rapid TPS Transient Plane Source Technology Thermal Conductivity Tester
1. Product Introduction
Thermal conductivity tester based on the transient plane heat source (TPS) method. The product is independently developed by Achievo Instrument, with stable test performance and strong data processing and analyzing capability, and can be applied to the thermal conductivity measurement of various materials.
The product is independently developed by Achievo Instrument, with stable test performance, strong data processing and analyzing capability, and can be applied to the thermal conductivity measurement of various materials.
2. Measurement object
Material type: metal, ceramic, alloy, ore, polymer, composite, paper, fabric, foam (flat surface insulation)
Thermal material, plate), polyurethane, phenolic, urine aldehyde, mineral wool (glass wool, rock wool, mineral wool), cement wall, glass
CRC strong composite board, cement polystyrene board, sandwich concrete, FRP panel composite board, paper honeycomb board, etc.
3. Technical parameters
| Test range |
0.001-300W /(m*K) |
| Measuring temperature range |
room temperature -- 130ºC |
| Probe diameter |
no. 1 probe 7.5mm;No. 2 probe 15mm |
| Accuracy |
0.001 |
| Measurement time |
5~160 seconds |
| Power supply |
AC 220V |
| machine power |
< 500W8. Sample temperature rise: <15ºC |
| Test sample power |
no. 1 probe power 0<P<1 w;No. 2 probe power 0<P<20 w. |
| sample specifications |
No. 1 probe sample (≥ 7.5*7.5*3.75mm) No. 2 probe sample (≥15*15*7.5mm) |
4. Instrument features
Wide test range, stable test performance, in the domestic similar instruments, is in the leading level;
Direct measurement, test time about 5-160s can be set, can quickly and accurately measure the thermal conductivity, save a lot of time;
It is not affected by contact thermal resistance as in the static method;
No special sample preparation is required, and there are no special requirements for sample shapes. All that is needed for lumpy solids is a relatively smooth sample surface with an overall length and width of at least twice the diameter of the probe;
Non-destructive testing of samples means that samples can be reused;
The probes are designed with a double helix structure and incorporate an exclusive mathematical model that utilizes a core algorithm to analyze and calculate the data collected on the probes;
Sample table with ingenious structural design, easy to operate, suitable for placing samples of different thicknesses, simple and beautiful;
Data acquisition on the probe using imported data acquisition chip, the high resolution of the chip, can make the test results more accurate and reliable;
The control system of the host uses THE ARM microprocessor, which is faster than the traditional microprocessor, improves the analysis and processing ability of the system, and makes the calculation results more accurate;
This instrument can be used for the measurement of thermal parameters of lumpy solids, pasty solids, granular solids, gels, liquids, powders, coatings, films, insulating materials and so on;
Intelligent human-machine interface, color LCD display, touch screen control, easy and simple operation;
Powerful data processing capabilities. Highly automated computerized data communication and report processing system.
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