Product Details:
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Warranty: | 1 Year | Operating Power: | 600W(40kV, 15mA) Or 1600W(40kV, 40mA), Stability: < 0.005% |
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Angle Measurement Range: | - 3 °- 150 ° | Instrument External Dimensions: | 580×450×680(L×W×H)mm |
Desktop Diffraction Instrument High Quality Benchtop XRD Diffractometer Machine
1.Product Introduction
Designed for industrial production and quality control, advanced technology for the production of concentrated X-ray diffractometers, functional and miniaturized benchtop X-ray diffractometers. It can precisely conduct qualitative analysis, quantitative analysis and crystal structure analysis on both metal and non-metal samples. It is especially suitable for the manufacturing industries of products such as catalysts, titanium dioxide, cement, and pharmaceuticals.
2.Product Parameter
Operating power |
600W(40kV, 15mA) or 1600W(40kV, 40mA), stability: < 0.005% |
X-ray tube |
Metal ceramic X-ray tube, Cu target, power 2.4KW, focus size: 1×10mm, air-cooled or water-cooled (water flow rate greater than 2.5L/min) |
Goniometer |
Sample level Optical coding technology and servo motors are adopted to drive the rotation of θs and θd |
Measurement method |
Continuous, step-by-step, Omg |
Angle measurement range |
- 3 °- 150 ° |
Minimum step width |
0.0001 ° |
Angle reproduction |
0.0005 ° |
Angular positioning speed |
1500°/min |
Detector |
Digital pulse processing counting or semiconductor array detector |
Counting throughput |
1×107CPS, 9×107CPS |
Energy spectrum resolution |
≤25% or ≤1keV |
Computer |
Business notebook |
Instrument control software |
Windows10 operating system, automatically controls the tube voltage, tube current, photoswitch and X-ray tube aging training of the X-ray generator. Control the goniometer to scan continuously or step by step, and simultaneously collect diffraction data. Conventional processing of diffraction data: automatic peak finding, manual bee finding, integration intensity, peak height, center of gravity, background subtraction, smoothing, peak shape magnification, spectrum comparison, etc. |
Data processing software |
Phase qualitative analysis, fixed-position analysis, Kα1, α2 exfoliation, full spectrum fitting, peak selection fitting, half-height width and grain size calculation, unit cell determination, Class II stress calculation, diffraction line indexing, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, quantitative analysis without calibration, full spectrum fitting (WPF), XRD diffraction spectrum simulation and other functions. |
Scattered line protection |
Lead + lead-glass protection, the light gate window is connected to the protective device, and the scattering line is calculated not more than 1μSv/h |
Comprehensive stability of the instrument |
≤0.5% |
One-time softening data of the sample |
Configure the sample changer, with a maximum of 6 samples loaded each time |
Instrument external dimensions |
580×450×680(L×W×H)mm |
Contact Person: Ms. Kaitlyn Wang
Tel: 19376687282
Fax: 86-769-83078748