logo
Αρχική Σελίδα ΠροϊόνταΑναλυτής XRF

Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device
Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Μεγάλες Εικόνας :  Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Λεπτομέρειες:
Place of Origin: China
Μάρκα: Lonroy
Πιστοποίηση: CE ISO ASTM
Model Number: LR-A086
Πληρωμής & Αποστολής Όροι:
Minimum Order Quantity: 1
Τιμή: Negotaible
Packaging Details: wooden package
Delivery Time: 5-8 work days
Payment Terms: L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability: 200

Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

περιγραφή
Maximum Measuring Speed: 2 mm/s Marble Dimensions: 500 mm × 800 mm
Z1 Linear Accuracy: ≤±(0.5 +|0.02H|) μm Warranty: 1 Year
X-axis Driving Mode: Electric Y-axis Driving Mode: Electric

Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device

Description

The surface topography measurement instrument is a measurement device specifically designed for the microscopic morphology analysis of high-precision parts, featuring high-precision measurement capabilities and excellent stability.

In the field of precision manufacturing, the traditional measurement method of just one dimension is no longer sufficient to meet the stringent quality requirements of modern industries for parts. Although conventional size detection can reflect the geometric tolerances of parts, it is difficult to capture the key influence of the surface micro-topography on the performance of the parts.

The topography measurement instrument breaks through the limitations of traditional measurement methods and is specifically designed for the microscopic morphology analysis of high-precision parts. It adopts advanced contact sensor technology to accurately measure surface features ranging from nanometers to micrometers.


Technical Parameters

Measuring Range

X-axis

120-220 mm

 

X-axis Resolution

1.2 nm

 

Z-axis

420 mm, 620 mm (optional)

Profile Sensor

Z1-axis Measuring Range

30-60 mm

 

Z1 Resolution

1.2 nm

Profile Accuracy

Z1 Linear Accuracy

≤±(0.5 +|0.02H|) μm

 

Circular Arc

±(1 + R/12) μm

 

Circular Arc Pt

≤0.3 μm

 

Angle

±1′

 

Straightness

0.3 μm/100 mm (cut-off wavelength 0.8)

Driving Speed

X-axis Driving Mode

Electric

 

Y-axis Driving Mode

Electric

Maximum Measuring Speed

 

2 mm/s

Marble Dimensions

 

500 mm × 800 mm

Countertop Material

 

Natural marble


Στοιχεία επικοινωνίας
DONGGUAN LONROY EQUIPMENT CO LTD

Υπεύθυνος Επικοινωνίας: Ms. Kaitlyn Wang

Τηλ.:: 19376687282

Φαξ: 86-769-83078748

Στείλετε το ερώτημά σας απευθείας σε εμάς (0 / 3000)