The AL-Y500 diffractometer is the latest model of bench-top two-dimensional X-ray diffractometer. It adopts fixed-camera detection method, which is different from traditional scanning-type diffractometers. The X-ray array-type photon-counting semiconductor detector enables compatibility modes of 0D, 1D and 2D for points, lines and surfaces. 

It is mainly used for qualitative and quantitative analysis of polycrystalline samples, including quantitative analysis without reference samples, determination of crystallinity, crystal structure analysis, material structure analysis, grain size measurement, structure refinement, micro-area analysis, thin film and texture stress analysis, etc. It is applicable to various fields and industries such as minerals, pharmaceuticals, chemicals, metals and alloys, building materials, nanomaterials, batteries, food samples, biological samples, etc.

Features:

1.The detector performs fixed photography, which is different from the traditional scanning type diffraction instrument. The photography mode is highly efficient and fast, approximately 5-30 times faster than the scanning mode. It is suitable for in-situ analysis, and the diffraction information from all angles can be collected simultaneously. It has a high energy resolution, effectively reducing the fluorescence background. 

2.The angle measuring instrument θs and θd arms adopt servo motor drive and optical encoding control technology. The detector can perform double-position movement along the 2θ axis. The rotation of the angle measuring instrument is more stable, the diffraction angle measurement is more accurate, and the linearity is better. When the sample rotates along the θ axis, the control accuracy is 0.01°, and the accuracy of the 2θ axis angle is ±0.02°.

3.The detector components are composed of multiple detector units, which are uniformly fixedly distributed along the diffraction circle and provide seamless coverage for all angles; dual-layer 21-plate (or single-layer 10-plate) planar array detectors cover the 2θ range: -3° to 150°. 2D imaging is achieved, simultaneously collecting γ angle information, two-dimensional diffraction data, and the information is more abundant.

4.X-ray planar photonic counting semiconductor detector, with high sensitivity, capable of single photon counting, large dynamic range, dual thresholds; interchangeable point and line light sources, combining Debye-Scherrer and BB optical geometries, compatible with planar and cylindrical samples, compatible with detector 2D, 1D, and OD modes. Moreover, it has strong radiation resistance and long service life.

5.The scattering radiation protection device is safer and more reliable. During sample measurement, the radiation protection door will automatically be locked, ensuring that operators will not be exposed to scattering radiation under any circumstances.

6.The compact size enables it to be installed on an experimental bench, without the need for a specific laboratory environment. It is simple to use, operate and maintain.

Technical Parameter