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AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

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중국 DONGGUAN LONROY EQUIPMENT CO LTD 인증
중국 DONGGUAN LONROY EQUIPMENT CO LTD 인증
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AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment
AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

큰 이미지 :  AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

제품 상세 정보:
원래 장소: 중국
브랜드 이름: Lonroy
인증: CE ISO ASTM
모델 번호: Al-27 분
결제 및 배송 조건:
최소 주문 수량: 1
가격: Negotaible
포장 세부 사항: 나무 패키지
배달 시간: 5-8 일
지불 조건: L/C, D/A, D/P, T/T, Western Union, MoneyGram
공급 능력: 200

AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

설명
운용 전력: 600W 모델: Al-27 분
안정: 0.005% 보증: 1 년
최소 단계 너비: 0.0001 ° 전체 치수: 600 × 410 × 670mm
강조하다:

Desktop X Ray Diffractometer XRD

,

XRD Analysis Testing Equipment

,

XRF Analyzer with warranty

AL-27min Desktop X Ray Diffractometer XRD Analysis Testing Equipment

Description
Designed for industrial production and quality control, this advanced technology of concentrated X-ray diffraction instrument enables functional and miniaturized benchtop X-ray diffraction equipment. It can precisely conduct qualitative analysis, quantitative analysis and crystal structure analysis on metal and non-metal samples. It is particularly suitable for the manufacturing industries of catalysts, titanium dioxide, cement, pharmaceuticals, etc.


Technical Parameter

Operating Power (Tube Voltage, Tube Current)

600W (40kV, 15mA) or 1200W (40kV, 30mA); Stability: 0.005%

X-ray Tube

Metal-ceramic X-ray tube, Cu target, power 2.4kW, focal spot size: 1x10 mm; Cooling method: air-cooled or water-cooled (water flow rate > 2.5L/min)

Goniometer

Sample horizontal θs-θd structure, diffraction circle radius 150mm

Sample Measurement Modes

Continuous, Stepwise, Omg

Angle Measurement Range

-3° - 150° when θs/θd are linked

Minimum Step Width

0.0001°

Angle Reproducibility

0.0005°

Angle Positioning Speed

1500°/min

Counter

Sealed proportional counter or high-speed one-dimensional semiconductor counter

Energy Spectrum Resolution

Less than 25%

Maximum Linear Count Rate

≥5×10⁵ CPS (proportional counter); ≥9×10⁷ CPS (one-dimensional semiconductor counter)

Instrument Control Software

Windows 7 operating system; Automatically controls the tube voltage, tube current, shutter and X-ray tube aging training of the X-ray generator; Controls the goniometer for continuous or step scanning while collecting diffraction data; Performs routine processing of diffraction data: automatic peak searching, manual peak searching, integral intensity, peak height, center of gravity, background subtraction, smoothing, peak shape magnification, spectrum comparison, etc.

Data Processing Software

Functions include phase qualitative and quantitative analysis, Kα1 and α2 stripping, full spectrum fitting, selected peak fitting, calculation of full width at half maximum (FWHM) and grain size, unit cell determination, type II stress calculation, diffraction line indexing, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, standardless quantitative analysis, full pattern fitting (WPF), XRD diffraction spectrum simulation, etc.

Scattered Radiation Protection

Lead + lead glass protection; Interlock between shutter window and protective device; Scattered radiation dose ≤1μSv/h

Comprehensive Stability of the Instrument

≤1‰

Sample Loading Capacity at One Time

Equipped with a sample changer, capable of loading up to 6 samples at a time

Instrument Overall Dimensions

600×410×670 (w×d×h) mm


연락처 세부 사항
DONGGUAN LONROY EQUIPMENT CO LTD

담당자: Ms. Kaitlyn Wang

전화 번호: 19376687282

팩스: 86-769-83078748

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