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Product Details:
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| Type: | Testing Machine | Accuracy Class: | High Accuracy |
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| Accuracy: | / | Application: | Auto Testing |
| Customized Support: | OEM, ODM, OBM | Power: | --- |
| Protection Class: | Ip56 | Voltage: | 220 V |
| Warranty: | 1 Year | Weight: | 195kg |
| Highlight: | DM8000 WDXRF analyzer multi-element tester,X-ray fluorescence spectrometer oxide content analyzer,Wavelength dispersive element analyzer lab machine |
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DM8000 WDXRF Analyzer X-ray Fluorescence Spectrometer Wavelength Dispersive Multi-element Analyzer Element Oxide Content Tester
Simultaneous multi-channel measurement: fast, reliable, and highly accurate.
Particularly well-suited for the multi-element analysis requirements of industrial and mining enterprises.
Features
Wavelength Dispersive X-ray Fluorescence (WDXRF) analysis technology.
Imported Varian thin-beryllium end-window X-ray tube.
Moxtek 0.6μm ultra-thin polyester detector window.
Complies with standards
GB/T 176
JB/T 11145
JC/T 1085
Overview
The DM8000 Multi-element Analyzer (WDXRF) is a state-of-the-art instrument developed by our company, drawing upon decades of research experience in X-ray fluorescence (XRF) analysis. It builds upon our established DM series of analyzers—which include models for calcium/iron, sulfur, aluminum/silicon, and other multi-element applications. Utilizing simultaneous (or multi-channel) Wavelength Dispersive X-ray Fluorescence (WDXRF) technology, the instrument measures up to ten elements (ranging from Sodium to Uranium) concurrently. For most elements, the measurement range extends from ppm levels up to 100%. Key advantages include rapid analysis, high precision, minimal human error, low operator workload, a one-time investment cost, and a pollution-free operation. Consequently, it is widely used across industries such as building materials, metallurgy, petroleum, chemicals, geology, and mining.
The DM8000 incorporates high-quality imported components: a 400W thin-beryllium end-window X-ray tube from Varian; 0.6μm ultra-thin polyester windows from Moxtek for light-element channels (such as Na and Mg); and a constant-temperature chamber with precision better than 0.1°C. The gas flow system features a high-precision density stabilization device ensuring pressure stability within 3Pa, while a sample rotation mechanism eliminates measurement errors caused by sample inhomogeneity. These features ensure exceptional precision and accuracy, placing the instrument at the forefront of international technology. Its superior shielding design guarantees zero radiation leakage, meeting radiation exemption standards.
The DM8000 Multi-element Analyzer (WDXRF) demonstrates exceptional performance, particularly within my country's cement industry. This instrument was originally developed specifically for the cement industry. It complies with the national standard GB/T 176–2017 (Methods for Chemical Analysis of Cement) and industry standards JC/T 1085–2008 (X-ray Fluorescence Analyzers for Cement) and JB/T 11145–2011 (X-ray Fluorescence Spectrometers). Its performance surpasses that of comparable imported products, yet it costs only half as much, offering an unbeatable price-to-performance ratio. Furthermore, the convenience of after-sales service provided by domestic enterprises is unmatched by foreign competitors.
Applications
It is primarily used to measure the concentrations of Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, Fe2O3, and other elements in materials such as cement raw meal, clinker, finished cement, and raw materials. It can operate as a standalone unit or be integrated into an automated raw meal proportioning control system—linking the analyzer, a microcomputer, and a belt scale—to provide detection signals.
Beyond the cement industry, it is also suitable for analyzing the concentrations of Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, Fe2O3, etc., in solid, liquid, and powder samples across sectors such as power generation, brick and tile manufacturing, metallurgy, petroleum, and geology/mining.
Characteristics
Rapid & Simultaneous Analysis – Utilizes a simultaneous (or multi-channel) design to rapidly analyze all target elements at once, typically yielding concentration results within a few minutes.
High Accuracy – Employs wavelength-dispersive XRF technology, offering extremely high resolution—far superior to energy-dispersive systems—enabling accurate measurement of adjacent light elements.
Ease of Use – After sample preparation (pulverizing and pressing into pellets, or fusion), the user simply loads the sample and presses the [Start] button, achieving true one-touch operation.
Long-term Stability – Features a constant-temperature chamber, stable gas-flow density control, sample rotation, and variable-gain digital multi-channel electronics, ensuring excellent long-term stability.
High Reliability – The use of fixed channels minimizes moving parts; high system integration and strong environmental adaptability ensure high reliability. Powerful Software – Features include ratio or matrix effect correction, bias adjustment, statistics (such as pass rates), rate calculations, and error alerts; it also supports free
updates to the latest versions and the addition of functions based on user requirements.
Environmentally Friendly & Energy Efficient – Radiation protection meets exemption standards. Analysis is non-contact and non-destructive; it generates no pollution, requires no chemical reagents, and involves no combustion.
High Cost-Performance Ratio – No water cooling required; operating and maintenance costs are extremely low. Priced at half that of similar foreign products, making it well-suited to domestic conditions.
DM8000 WDXRF Analyzer X-ray Fluorescence Spectrometer Wavelength Dispersive Multi-element Analyzer Element Oxide Content TesterPrinciple
The operating principle is illustrated in Figure 2. The X-ray tube is positioned vertically, directing X-rays upward onto the sample; this minimizes the distance between them, thereby maximizing excitation efficiency. Upon irradiation by the X-ray tube, the sample emits X-ray fluorescence, which enters a dispersion chamber for spectral separation. Each element corresponds to a specific dispersion chamber. The X-ray fluorescence passes through a slit (if a curved analyzing crystal is used) or a Soller slit (if a flat analyzing crystal is used) toward the analyzing crystal. After diffraction by the crystal, the characteristic X-ray fluorescence corresponding to the specific element—satisfying the Bragg diffraction condition—passes through another slit or Soller slit to the detector. The detector and subsequent electronic circuitry measure the intensity of the characteristic X-ray fluorescence, and the element's concentration is then calculated using a calibration equation.
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Figure 2: Schematic diagram of the multi-channel WDXRF analysis principle
Since the X-ray fluorescence is separated by wavelength using a crystal, the technique is known as Wavelength Dispersive X-Ray Fluorescence (WDXRF). Resolution depends solely on the crystal rather than the detector, resulting in high resolution—an order of magnitude higher than that of energy-dispersive systems.
Key Components
Imported thin-beryllium end-window X-ray tube (manufactured by Varian, USA)
Utilizes the EG-60 thin-beryllium end-window X-ray tube from Varian (USA). This is an end-window tube where the X-ray beam is perpendicular to the target; the short distance from the focal spot to the sample enhances excitation efficiency. Featuring a thin beryllium window and a rhodium target, it enables highly efficient detection of light elements. The cathode is grounded, eliminating the need for a highly insulated filament transformer as well as electron bombardment of the beryllium window and the resulting heating. With a power rating of 400 W, it requires only air cooling rather than water cooling; due to its simultaneous multi-channel measurement capability, its performance is equivalent to that of a large 4000 W scanning (or single-channel) X-ray tube. Figure 3 shows its outline drawing.
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Figure 3 EG-60 thin beryllium end-window X-ray tube
Incorporates a 0.6 μm ultra-thin polyester window from Moxtek (USA)
For the measurement of light elements such as Na and Mg, the detector window is critical; it must be both sufficiently thin and robust. This instrument utilizes the 0.6 μm thick ProLINE Series 20 window from Moxtek (USA). This window consists of an ultra-thin polymer layer and a charge-dissipating layer (coated with 200 Å of aluminum) bonded to a sturdy hexagonal metal support frame, thereby achieving high transmission for low-energy X-rays. Analysis of B (Kα) is possible. Figure 4 shows its outline drawing, and Figure 5 shows the relationship between energy and transmission.
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Figure 4 Moxtek ultra-thin polyester window
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Figure 5 ProLINE Series energy vs. transmission
Thermostatic chamber temperature control precision better than 0.1°C
A wavelength-dispersive analyzer is a precision instrument; the crystal, in particular, has extremely strict requirements regarding mechanical dimensions. Even minute dimensional changes caused by temperature fluctuations can lead to variations in intensity, necessitating a constant-temperature environment for the spectrometer chamber. The temperature control precision of the instrument's thermostatic chamber is better than 0.1°C. Furthermore, in addition to the spectrometer chamber, components such as the detector assembly and associated electronics are housed within this thermostatic chamber, ensuring the instrument remains unaffected by external temperature changes.
Gas flow system employs a high-precision gas density stabilization device; pressure stability is better than 3 Pa
The detector used in this instrument is a gas-flow proportional counter developed and manufactured in-house. Maintaining constant gas density is essential for detector stability; the instrument's gas flow system utilizes a high-precision gas density stabilization device, achieving a pressure stability of better than 3 Pa.
Equipped with a sample rotation mechanism to eliminate measurement errors caused by sample non-uniformity. When samples are prepared using the powder pellet method, the presence of SiO2—due to its high hardness—can result in uneven particle sizes and, consequently, an irregular sample surface. To minimize measurement errors caused by such sample non-uniformity, this instrument is equipped with a sample rotation mechanism.
TDM8000 WDXRF Analyzer X-ray Fluorescence Spectrometer Wavelength Dispersive Multi-element Analyzer Element Oxide Content Tester
Technical Specification
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X-ray Tube |
Voltage: ≤50keV, Current: ≤8.0mA, Power: ≤400W |
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Detector |
Ultra-thin window gas-flow proportional counter tube |
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Measurable Elements or Oxides |
Any ten elements or their oxides from Na to U; taking cement as example (same below): Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, Fe2O3, etc. |
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Measurement Range |
Analysis ranges for Na2O, MgO, Al2O3, SiO2, SO3, TiO2, K2O, CaO, Fe2O3, etc. are adjustable and selected via calibration |
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Measurement Range Width |
Na2O max—Na2O min ≤5%, MgO max—MgO min ≤5%, Al2O3 max—Al2O3 min ≤5%, SiO2 max—SiO2 min ≤7%, SO3 max—SO3 min ≤5%, TiO2 max—TiO2 min ≤5%, K2O max—K2O min ≤5%, CaO max—CaO min ≤7%, Fe2O3 max—Fe2O3 min ≤5% |
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Measurement Accuracy |
SNa2O ≤0.01%, SMgO ≤0.03%, SAl2O3 ≤0.04%, SSiO2 ≤0.04%, SSO3 ≤0.01%, STiO2 ≤0.01%, SK2O ≤0.01%, SCaO ≤0.03%, SFe2O3 ≤0.02% |
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Compliance Standards |
GB/T 176—2017, JC/T 1085—2008, JB/T 11145—2011, etc. |
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System Measurement Time |
1~999s, recommended: 180s |
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Constant Temperature Chamber |
36℃ ± 0.1℃ |
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Operating Conditions |
Ambient temperature: 15~28℃, Relative humidity: ≤75% (25℃), Power supply: 220V ± 20V, 50Hz, ≤1.0kW |
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Dimensions & Weight |
790mm (W) × 760mm (D) × 1200mm (H), 195kg |
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Contact Person: Kaitlyn Wang
Tel: 19376687282
Fax: 86-769-83078748